Mfg Part Number: WS57C64F 70D
Alternate P/N: WS57C64F70D
NSN : 5962-01-319-0513
NIIN : 013190513
CAGE Code : 66579
Manufacturer: Waferscale Integration Inc
Item Name : Microcircuit Memory
Here at Internet For Aviation, we have WS57C64F 70D Microcircuit Memory from Waferscale Integration Inc, as well as a variety of other parts from reliable manufacturers. As the only independent distributor with a No China Sourcing policy, we go to great lengths to ensure that we source responsibly when it comes to certified standard items. If you’re in need of a specific WS57C64F 70D to aid you in your aircraft repair capabilities, simply search by NSN part number, NSN or Cage Code on our parts directory. Submit an instant RFQ and a representative will get back to you in as little as 15 minutes.
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| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-319-0513 Item Description: Microcircuit Memory | 5962 | 013190513 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| WS57C64F 70D | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 1.280 INCHES MAXIMUM |
| ADAQ | BODY LENGTH | 1.280 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.210 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | +0.0 TO 70.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | 65.0 TO 150.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| ABKW | OVERALL HEIGHT | 0.355 INCHES NOMINAL |
| ABMK | OVERALL WIDTH | 0.620 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.550 INCHES MAXIMUM |
| CBBL | FEATURES PROVIDED | BIPOLAR AND BURN IN AND ERASABLE AND HIGH PERFORMANCE AND HIGH SPEED AND LOW POWER AND PROGRAMMABLE |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 11 INPUT |
| CZEQ | TIME RATING PER CHACTERISTIC | 70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 70.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | ROM |
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